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Phys. Rev. A 80, 014501 (2009) [4 pages]

Electron affinity of arsenic and the fine structure of As measured using infrared photodetachment threshold spectroscopy

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C. W. Walter*, N. D. Gibson, R. L. Field, III, A. P. Snedden, J. Z. Shapiro, and C. M. Janczak
Department of Physics and Astronomy, Denison University, Granville, Ohio 43023, USA

D. Hanstorp
Department of Physics, University of Gothenburg, SE-412 96 Gothenburg, Sweden

Received 11 May 2009; published 2 July 2009

The binding energy and fine-structure splittings of the arsenic negative ion (As) have been measured using infrared photodetachment threshold spectroscopy. The relative cross section for neutral atom production was measured with a crossed ion-beam-laser-beam apparatus over selected photon energy ranges between 630–810 meV. An s-wave threshold was observed due to the opening of the As(4p43P2) to As(4p34S3/2) ground-state to ground-state transition, which yields the electron affinity of As to be 804.8(2) meV. s-wave thresholds were also observed for detachment from the J=1 and J=0 excited levels of As, permitting accurate determination of the fine-structure splittings of 127.6(2) meV for 3P13P2 and 164.3(10) meV for 3P03P2. The present values are consistent with previous measurements and substantially reduce the uncertainties.

© 2009 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevA.80.014501
DOI:
10.1103/PhysRevA.80.014501
PACS:
32.10.Hq, 32.80.Gc

*walter@denison.edu

gibson@denison.edu