Phys. Rev. A 75, 015401 (2007) [4 pages]Loading and characterization of a printed-circuit-board atomic ion trapReceived 29 June 2006; published 19 January 2007 We demonstrate loading of 88Sr+ ions into a 0.5-mm-scale printed circuit board surface-electrode ion trap. We then characterize the trap by measuring the secular frequencies and comparing them to a three-dimensional simulation of the trap, and by measuring the stray electric fields along two of the trap’s principal axes. Cancelling these fields by applying additional voltages enables a hundredfold increase in the trap lifetime to greater than ten minutes at a vacuum of 10−9 torr. © 2007 The American Physical Society URL:
http://link.aps.org/doi/10.1103/PhysRevA.75.015401
DOI:
10.1103/PhysRevA.75.015401
PACS:
33.80.Ps
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