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Phys. Rev. A 71, 032714 (2005) [5 pages]

Selectivity in valence excitation processes of noble atoms studied by fast electron impact

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Hua-Dong Cheng, Lin-Fan Zhu*, Xiao-Jing Liu, Zhen-Sheng Yuan, Wen-Bin Li, and Ke-Zun Xu
Hefei National Laboratory for Physical Sciences at Microscale, Department of Modern Physics, University of Science and Technology of China, Hefei, Anhui 230026, China

Received 13 September 2004; published 21 March 2005

The experimental and theoretical ratios of the generalized oscillator strength (GOS) for valence excitations of Ne, Ar, and Kr are presented. The excitation selectivity for fast electron impact is elucidated: the LS coupling singlet nature of the ground state selects the LS coupling singlet components from the intermediate coupling wave function of the excited state. According to this rule, the GOS’s for some unresolved transitions were determined. Furthermore, this work provides an experimental method to determine the intermediate coupling coefficients of singlet components.

© 2005 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevA.71.032714
DOI:
10.1103/PhysRevA.71.032714
PACS:
34.80.Gs, 33.70.Fd, 31.15.Ne

*Corresponding author. Email address: lfzhu@ustc.edu.cn