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Phys. Rev. A 65, 024702 (2002) [4 pages]

Fine-structure-resolved measurements of photoelectron angular distributions by single-photon detachment of Sn- at visible wavelengths

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V. T. Davis
Department of Physics, United States Military Academy, West Point, New York 10996

J. Ashokkumar and J. S. Thompson
Department of Physics and Chemical Physics Program, University of Nevada, Reno, Nevada 89557-0058

Received 14 March 2001; published 16 January 2002

The spectral dependence of the angular distributions of photoelectrons produced by the single-photon detachment of Sn-[core,(5s2,5p3)] ions has been measured at four discrete photon wavelengths ranging from 457.9 to 514.5 nm (2.71–2.41 eV) using a crossed laser-ion beams apparatus. Values of the fine-structure-resolved asymmetry parameters have been determined by fits to the photoelectron yield as a function of the angle between the photon polarization vector and the linear momentum vector of the collected photoelectrons. The measured asymmetry parameters for Sn- are compared to previous asymmetry parameter measurements for negative ions with similar electronic configurations. The measurements were also fit to a previously reported model for photoelectron asymmetry parameters for photodetaching p-orbital electrons from negative ions.

© 2002 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevA.65.024702
DOI:
10.1103/PhysRevA.65.024702
PACS:
32.80.Gc, 32.10.-f, 33.60.-q