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Phys. Rev. A 59, 3673–3680 (1999)

Observation of soft x rays of single-mode resonant transition radiation from a multilayer target with a submicrometer period

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Koji Yamada* and Teruo Hosokawa
NTT System Electronics Laboratories, 3-1 Morinosato-Wakamiya, Atsugi 243-0198, Japan

Hisataka Takenaka
NTT Advanced Technology, 1-1-3 Gotenyama, Musashino 180-8639, Japan

Received 2 October 1998; published in the issue dated May 1999

The soft x rays produced by resonant transition radiation from a multilayer target with a submicrometer period were measured. The target consisted of 176-nm-thick nickel as radiators and 221-nm-thick carbon as spacers alternately stacked on a SiN membrane. The target was bombarded by 15-MeV electrons, and the angular dependence of the resulting x-ray spectra was measured. The spectra had a clear single peak at energies from 2 to 4 keV depending on the observation angle. The spectral dependence on the incident angle of the electron beam was also measured, and a shift of the peak energy was observed. These experimental results showed a good agreement with theoretical estimations. These results are clear evidence of single-mode resonant transition radiation.

© 1999 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevA.59.3673
DOI:
10.1103/PhysRevA.59.3673
PACS:
79.20.Kz, 41.75.Ht, 07.85.-m, 78.70.-g

*Author to whom correspondence should be addressed. FAX:+81-462-40-4324. Electronic address: kyamada@aecl.ntt.co.jp