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Phys. Rev. A 58, 4572–4580 (1998)

Electron-impact excitation and collisional transfer into the nF levels of helium

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J. Ethan Chilton and Chun C. Lin
Department of Physics, University of Wisconsin, Madison, Wisconsin 53706

Received 29 June 1998; published in the issue dated December 1998

Through the use of Fourier-transform spectroscopy, the electron-impact optical cross sections for the infrared emissions from the 4F, 5F, and 6F levels of the helium atom have been measured for gas pressures between 3 and 50 mTorr and incident electron energies from threshold to 200 eV. The very strong pressure dependence of these measured emission cross sections at different energies is in excellent quantitative agreement with the mechanism of excitation transfer from the n1P levels through collisions with ground-state helium atoms. From our data, we determine the electron-impact cross sections for excitation into the 4F, 5F, and 6F levels. The effects of the singlet-triplet mixing in the nF states on the excitation cross sections are discussed. The excitation data of the 5F level are compared with those of 51S and 51D. We have also obtained the n1P⃗nF collisional excitation transfer cross sections for n=4–7.

© 1998 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevA.58.4572
DOI:
10.1103/PhysRevA.58.4572
PACS:
34.80.Dp, 34.80.My