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Phys. Rev. A 56, 1598–1606 (1997)

Selective reflection by Rb

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Ping Wang, A. Gallagher, and J. Cooper
JILA, National Institute of Standards and Technology and University of Colorado, Boulder, Colorado 80309-0440

Received 8 January 1997; published in the issue dated August 1997

Perpendicular reflection of low-power, near-resonant radiation at a sapphire–Rb-vapor interface (selective reflection) has been measured for Rb densities of 3×1014–3×1017/cm3. At the lowest density the eight hyperfine components are essentially isolated, and at the highest pressure they are highly blended. The data have been fitted to a coherent superposition of the reflected field amplitudes of the eight components, including the well-known starting transient and wall interaction. At low to moderate densities this yields a good fit to the data, and a result for the Rb-Rb collisional shift. At the higher densities the rapid attenuation of the incident field has a major effect on the reflection spectrum, and an approximation to this is included in the calculation, assuming exponential attenuation at the equilibrium-vapor rate. This provides improved fits to the data and allows the apparent Lorentz-Lorenz plus collisional shift to be evaluated. However, the data do not fully fit this calculation, and a complete self-consistent-field calculation appears necessary to fully understand the high-pressure results.

© 1997 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevA.56.1598
DOI:
10.1103/PhysRevA.56.1598
PACS:
42.50.Fx, 32.70.Jz