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Phys. Rev. A 53, 206–211 (1996)

H0+N2 collisions at low-kilo-electron-volt energies

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E. J. Quintana and E. Pollack
Department of Physics, University of Connecticut, Storrs, Connecticut 06269-3046

Received 30 May 1995; published in the issue dated January 1996

Direct scattering (→H0), stripping (→H+), and electron capture (→H-) are studied at energies of 1.0, 2.0, and 3.0 keV in small-angle H0+N2 collisions. Time-of-flight and electrostatic-energy analysis are used to identify the dominant collision processes. The electronically elastic channel is found to be weak beyond the very smallest scattering angles. As an example, at 1.0 keV, electronically inelastic processes dominate the collision for scattering angles larger than 0.2°. Beyond the smallest angles, both the stripping and electron-capture processes can also result in electronic excitation of the N2 or N2+. The reduced cross sections, when plotted as a function of reduced scattering angle, are shown to scale reasonably well for each of the three processes studied. © 1996 The American Physical Society.

© 1996 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevA.53.206
DOI:
10.1103/PhysRevA.53.206
PACS:
34.50.Gb, 34.90.+q